Stability of Atomic Force Microscopy
Tian Wenchao.Jia Jianyuan
(School of the Electro-Mechanical engineering, Xidian University, Xi'an city, 710071, China)

Abstract: Snap back affects violently the capability of the Atomic Force Microsc ope (AFM). On the basis of the Wigner-Seitz model micro-continuum medium theory, the mathematic model of contact force between the tip and the sample of the AFM, including repulsive force, is constructed. It is found after a simulation that the instabale balance point leads to the snap back, and heightening the canti lever rigidity facilitates eliminating it.
Keywords: atomic force microscopy, snap back, instability balance.